Hitachi’s next generation Cold Field Emission SEM offers unmatched low‑voltage imaging and comprehensive analytical microanalysis with the uncompromised performance of CFE.
The 8200 Series FE-SEM employs a novel cold field emission (CFE) gun for improved imaging and analytical performance. The newly designed Hitachi CFE gun complements the inherent high resolution and brightness of conventional CFE with increased probe current and beam stability.
New Source and Detection Technology from Hitachi:
The members of the SU8200 family offer a variety of stage, specimen chamber and signal detection system configurations to meet the wide range of customer-specific needs for indispensable ultra-high-resolution microscopy in the nanotechnology fields, such as semiconductors, electronics, catalysis and other functional materials, biotechnology, pharmaceuticals, and more.
Launched in August 2012, the new X-MaxNrange of Silicon Drift Detector exploits a new sensor chips, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.
The X-MaxN Silicon Drift Detector comes in a range of detector sizes, from 20 mm2 for microanalysis up to an astounding 150 mm2 for advanced nanoanalysis. The latter is the largest SDD in the market and delivers more than double the speed of any other detector.
Patrick Woodell, Lab Manager
Hitachi’s next generation Cold Field Emission SEM offers unmatched low‑voltage imaging and comprehensive analytical microanalysis with the uncompromised performance of CFE. Approved users are able to reserve ARC's SEM.Learn More
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